.Capacitance is the ratio of the change in an in a system to the corresponding change in its. There are two closely related notions of capacitance: self capacitance and mutual capacitance. Any object that can be electrically charged exhibits self capacitance. A material with a large self capacitance holds more electric charge at a given than one with low capacitance. The notion of mutual capacitance is particularly important for understanding the operations of the, one of the three elementary electronic components (along with and ).The capacitance is a function only of the geometry of the design (e.g. Area of the plates and the distance between them) and the of the material between the plates of the capacitor. For many dielectric materials, the permittivity and thus the capacitance, is independent of the potential difference between the conductors and the total charge on them.The unit of capacitance is the (symbol: F), named after the English physicist.

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A 1 farad capacitor, when charged with 1 of electrical charge, has a potential difference of 1 between its plates. The reciprocal of capacitance is called. Main article:A is a piece of used to measure capacitance, mainly of discrete. For most purposes and in most cases the capacitor must be disconnected from.Many DVMs have a capacitance-measuring function. These usually operate by charging and discharging the with a known and measuring the rate of rise of the resulting; the slower the rate of rise, the larger the capacitance. DVMs can usually measure capacitance from to a few hundred microfarads, but wider ranges are not unusual.

It is also possible to measure capacitance by passing a known through the device under test and measuring the resulting across it (does not work for polarised capacitors). An 2700A capacitance bridgeMore sophisticated instruments use other techniques such as inserting the capacitor-under-test into a. By varying the values of the other legs in the bridge (so as to bring the bridge into balance), the value of the unknown capacitor is determined. This method of indirect use of measuring capacitance ensures greater precision. Through the use of and other careful design techniques, these instruments can usually measure capacitors over a range from picofarads to farads.See also.References. Collins. William D.

Greason (1992). Research Studies Press. Retrieved 4 December 2011.; University of New South Wales.

Tipler, Paul; Mosca, Gene (2004). Physics for Scientists and Engineers (5th ed.). P. 752. Massarini, A.; Kazimierczuk, M.K.

'Self capacitance of inductors'. IEEE Transactions on Power Electronics. 12 (4): 671–676.:: example of the use of the term 'self capacitance'.

Jackson, John David (1999). Classical Electrodynamic (3rd ed.). John Wiley & Sons. P. 43.

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(1873). A treatise on electricity and magnetism.

Clarendon Press. Retrieved 20 September 2010.

Just Radios. Volume 1b — Basic Electricity — Alternating Current. Bureau of Naval Personnel. P. 197. ^ Jackson, J. Classical Electrodynamics.

P. 80. Binns; Lawrenson (1973). Analysis and computation of electric and magnetic field problems. Pergamon Press.

^ Maxwell, J. A Treatise on Electricity and Magnetism. 266ff. Rawlins, A. 'Note on the Capacitance of Two Closely Separated Spheres'.

IMA Journal of Applied Mathematics. 34 (1): 119–120.

Jackson, J. Classical Electrodynamics. P. 128, problem 3.3. Maxwell, J. 'On the electrical capacity of a long narrow cylinder and of a disk of sensible thickness'. IX: 94–101. Vainshtein, L.

'Static boundary problems for a hollow cylinder of finite length. III Approximate formulas'. 32: 1165–1173. Jackson, J. 'Charge density on thin straight wire, revisited'. 68 (9): 789–799. Raphael Tsu (2011).

Superlattice to Nanoelectronics. Pp. 312–315.

^ T. 'Discrete charge dielectric model of electrostatic energy'. 69 (6): 414–418.:.

Mario forever 5 for windows 7. G. Macucci (1995). 'Capacitive nature of atomic-sized structures'. 52 (15): 9. T. LaFave Jr; R. Tsu (March–April 2008).

Microelectronics Journal. 39 (3–4): 617–623. Archived from (PDF) on 22 February 2014. Retrieved 12 February 2014. ^ Laux, S.E.

(October 1985). 'Techniques for small-signal analysis of semiconductor devices'. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 4 (4): 472–481. Jonscher, A.K. 'The physical origin of negative capacitance'. Faraday Trans.

82: 75–81. Ershov, M.; Liu, H.C.; Li, L.; Buchanan, M.; Wasilewski, Z.R.; Jonscher, A.K. (October 1998). 'Negative capacitance effect in semiconductor devices'. Electron Devices.

45 (10): 2196–2206.:.Further reading.